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CoursesVLSI Embedded Systems And Chip Design
DFT (Design for Testability)
VLSI Embedded Systems And Chip Design
DFT (Design for Testability)

Learn how to use DFT techniques to make sure that modern VLSI chip designs are tested quickly, cover all faults, and improve yield.

5/5(4,890 Reviews)

Level

Advanced

Duration

8 Weeks

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About DFT (Design for Testability)

Rated #1 Recognized as the No.1 Institute for DFT (Design for Testability) Online Training Course. This program gives you real-world experience adding testability features to ASIC and SoC designs. The course covers JTAG standards, ATPG, BIST, fault modeling, and scan design to make sure that testing is of high quality. Learners will also learn how to use simulation and debugging to make sure that chips work properly even when there are faults. By the end of the course, students will know how to make circuits that are easy to test, get the most out of fault coverage, and lower the cost of testing in semiconductor design projects.

Training Plan

01

About trainer

Working professional who is carrying more then 10 years of industry experience.

02

Decks & Updated Content

Access to updated presentation decks shared during live training sessions.

03

e-Book

E-book provided by TechPratham. All rights reserved.

04

Assignments & MCQs

Module-wise assignments and MCQs provided for practice.

05

Video Recording

Daily Session would be recorded and shared to the candidate.

06

Projects

Live projects will be provided for hands-on practice.

07

Resume Building

Expert-guided resume building with industry-focused content support.

08

Interview Preparation

Comprehensive interview preparation with real-time scenario practice.

DFT (Design for Testability) Course Curriculum

 Introduction to DFT


Overview of test challenges and the need for DFT in VLSI.

Manufacturing defects
Test vs verification
Importance of DFT
DFT in ASIC/SoC flow
Test cost and yield

Fault Models & Test Concepts


Understanding defects and fault modeling techniques.

Stuck-at faults
Transition faults
Bridging faults
Delay faults
Fault coverage metrics

Scan Design Basics


Scan-based testing fundamentals.

Scan flip-flops
Scan chains
Scan modes
Scan insertion flow
Scan architecture

 ATPG (Automatic Test Pattern Generation)


Generation of test patterns to detect faults.

ATPG algorithms
Test pattern generation
Compression techniques
Coverage analysis
ATPG reports

 Test Compression & Power-Aware DFT

Reducing test time and power consumption.

Test data compression
Scan compression
Power issues during test
X-handling techniques
Low-power DFT

Memory Testing & BIST

Testing of embedded memories and logic blocks.

Memory fault models
MBIST architecture
Logic BIST (LBIST)
Self-test controllers
Repair analysis

VLSI Embedded Systems And Chip Design Courses

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Key Projects

DFT (Design for Testability)

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Scan Chain Insertion Project

Design and implement scan chains for a given RTL block, simulate fault coverage, and analyze improvements in controllability and observability.

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ATPG Pattern Generation & Simulation

Use ATPG tools to generate test patterns for stuck-at and transition faults, then validate through fault simulation and coverage reporting.

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Memory BIST Design

Implement a Built-In Self-Test architecture for SRAM, including test pattern generation, response checking, and signature analysis.

Placement Process

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What Makes TechPratham Training Different?

Real-World Implementation
Live enterprise tenant access for 24/7 practice on real-world, enterprise-grade scenarios.
Restricted or simulation-based access that lacks real-world complexity.
Subject Matter Experts
Mentorship from certified professionals with 15+ years of global industry experience.
Generic instructors with no hands-on implementation background.
2026 Ready Curriculum
AI-driven curriculum with advanced platform integrations and real-world configurations.
Basic, outdated syllabus that misses key technical integrations.
Daily & Weekly assignments
Daily assignments and weekly assessments focused on concept reinforcement and continuous feedback.
Self-paced learning with no accountability or progress tracking.
End-to-End Lifecycle
Hands-on project testing and deployment with portfolio-ready real-world exposure.
Basic lab exercises without any deployment or testing practice.
Interview Readiness
Structured interview preparation including mock interviews, PD sessions, and alumni guidance.
Minimal support limited to a generic certificate of completion.
Placement Support
Guaranteed interview support through tie-ups with top MNCs and 1-on-1 mock interview sessions.
Basic career tips with no direct industry connections.
Training Support
24/7 technical doubt resolution and personalized mentoring support.
Limited mentor availability and no support after class hours.
Affordable Fees
Competitive fixed pricing with flexible payment options and transparent fee structure.
Inflated fees with hidden costs and low return on investment.
FAQ's
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