VLSI Embedded Systems And Chip Design
DFT (Design for Testability)
Learn how to use DFT techniques to make sure that modern VLSI chip designs are tested quickly, cover all faults, and improve yield.
5/5(4,890 Reviews)
Level
Advanced
Duration
8 Weeks
What is DFT (Design for Testability)?
Rated #1 Recognized as the No.1 Institute for DFT (Design for Testability) Online Training Course.
This program gives you real-world experience adding testability features to ASIC and SoC designs. The course covers JTAG standards, ATPG, BIST, fault modeling, and scan design to make sure that testing is of high quality. Learners will also learn how to use simulation and debugging to make sure that chips work properly even when there are faults. By the end of the course, students will know how to make circuits that are easy to test, get the most out of fault coverage, and lower the cost of testing in semiconductor design projects.
Training Plan
About trainer
Working professional who is carrying more then 10 years of industry experience.
Decks
The candidate will get access to the presentation taken-up during the session.
Notes
Consolidated notes in word document.
Assignments
Assignments for every module will be covered.
MCQs
MCQs for every module covered in the session would be provided.
Video Recording
Daily Session would be recorded and shared to the candidate.
Dumps for Certification
We will provide dumps for the certification exam, which will help you to prepare for the exam.
Updated Content
We provide Generative AI Driven content By experts.
Projects
3 Live Projects will be provided for practice.
DFT (Design for Testability) Course Curriculum
.
Introduction to DFT
Section 1
Basics and importance of testability in VLSI design
Need for DFT
Fault models
Stuck-at faults
Overview of test strategies
Key Projects
DFT (Design for Testability)
Scan Chain Insertion Project
Design and implement scan chains for a given RTL block, simulate fault coverage, and analyze improvements in controllability and observability.
ATPG Pattern Generation & Simulation
Use ATPG tools to generate test patterns for stuck-at and transition faults, then validate through fault simulation and coverage reporting.
Memory BIST Design
Implement a Built-In Self-Test architecture for SRAM, including test pattern generation, response checking, and signature analysis.
DFT (Design for Testability) – Associate Training Program
Category
Associate
Exam Name:
DFT (Design for Testability) – Associate
Exam Code:
N.A.
Exam Duration:
N.A.
Exam Format:
N.A.
Passing Score:
N.A.
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Frequently Asked Questions (FAQs)
Why is DFT important in VLSI design?
DFT makes it possible to test complicated chips quickly and accurately, which increases fault coverage, lowers manufacturing costs, and boosts overall yield and reliability.
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