Rated #1 Recognized as the No.1 Institute for DFT (Design for Testability) Online Training Course. This program gives you real-world experience adding testability features to ASIC and SoC designs. The course covers JTAG standards, ATPG, BIST, fault modeling, and scan design to make sure that testing is of high quality. Learners will also learn how to use simulation and debugging to make sure that chips work properly even when there are faults. By the end of the course, students will know how to make circuits that are easy to test, get the most out of fault coverage, and lower the cost of testing in semiconductor design projects.





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